EPL Testing Module
SC-EPL
Product introduction
EPL Inspection Equipment SC-EPL
Based on traditional PL technology, with EL-level inspection and imaging capabilities — accurately identifying minority carrier and series resistance related defects.
China's First PL+EL Dual-Technology Integration
EPL Inspection Equipment is the first product in China independently developed by Vision Potential, based on traditional PL technology, with EL-level inspection and imaging capabilities. Unlike traditional PL and EL inspection equipment that suffer from single-function limitations, EPL can compatibly and accurately identify various defects such as minority carrier and series resistance related defects in cells, breaking the limitations of single-device inspection through technological integration.
Integrating PL (Photoluminescence) and EL (Electroluminescence) dual inspection technologies, it constructs an integrated inspection system: deeply exploring intrinsic defects in the non-energized state while accurately diagnosing electrical performance issues. It runs through the entire lifecycle of photovoltaic products from R&D to mass production.
SC-EPL Device Diagram400×350×600mm | Approx. 20kg
Core Advantages
01
Full-process Defect Control · Fault Traceability
- Non-contact inspection, probe-free, near-zero breakage rate
- Full coverage of cracks/broken grid/cold solder/black spots/concentric circles
- Series resistance imaging superior to traditional EL, higher accuracy
- Automatic yield statistics, closed-loop alarm with production line
02
Self-developed AI Intelligent Algorithm
- Integrated AI detection algorithm, quickly set defect standards
- Integrated Windows host software, one-click parameter configuration
- RGB three-channel color imaging, enhanced detail resolution efficiency
03
High Compatibility · Multiple Scenarios
- Compatible with PERC/TOPCon/HJT/xBC and other high-efficiency cells
- Plug-and-play for online/offline machines, customized rails
- Fully compatible with half-cells/full cells 156~210mm
Applications
Cell Manufacturing · Core Sorter Configuration
Module Encapsulation · Key String Soldering Inspection
University/Laboratory · Research & Process Optimization
A
Cell Manufacturing
Covers online/offline inspection throughout the cell production process, core configuration for cell sorters.
B
Module Encapsulation Inspection
Defect detection in lamination, soldering, junction box assembly processes; key equipment for string soldering inspection.
C
University/Laboratory
Core test tool for performance analysis and process optimization in PV material and cell technology R&D.
Panoramic Functions
01
Cell Process Verification
Doping uniformity, edge over/under etching, PN junction anomalies; passivation effect; broken grid/faint printing/shorts/cracks.
02
Final Sorting
Minority carrier lifetime + defect distribution + EL electrical performance, multi-dimensional grading (A/B/reject), ensuring module consistency.
03
Module Encapsulation Inspection
Defect analysis before/after lamination, string soldering defects, secondary lattice damage, EL+PL dual report.
04
PV R&D
Analysis of series resistance/minority carrier defects, intrinsic material properties/electrical performance, process parameter iteration guidance.
Technical Specifications
Parameter Specification Model SC-PLEL-PS (SC-EPL Series) Camera Specifications NIR enhanced, 1MP, exposure 10μs~10s, response 400-1200nm Infrared Pixels 1MP Lens Specifications HD wide-angle 16/25/45mm optional, FOV ≥80° Light Source Specifications Semiconductor laser, main wavelength 808±5nm Spot Uniformity ≥90% (within effective detection area) Exposure Cycle 200μs~1000μs, step 1ms adjustable Detection Wavelength Range 900~1300nm (for crystalline silicon) Compatible Sizes 156×156mm ~ 210×210mm (half/full cells) Inspection Objects Crystalline silicon cells (PERC/TOPCon/HJT/xBC); bare, with film, encapsulated modules Detectable Defect Types Cracks, broken grid, fragments, scratches, cold solder, over-etching, black spots, concentric circles, low-efficiency cells, contamination, etc. Stage Size Adaptable to automated tracks (customizable) Control Method Proprietary host software fully automated control Detection Accuracy Crack width > 50μm detectable Imaging Accuracy ≥0.2mm/pixel Focus Mode / Distance Manual focus / 400-650mm Hardware Mount Aluminum profile, sheet metal Inspection Time 0.5s~2s (based on automation cycle) Test Platform Windows + standard AI inspection software Power 500-1000W Power Supply Protection Reverse current/overload/leakage/ESD/overheat protection Computing Device Industrial computer Ambient Temperature 15-50℃, Humidity 30%-70% (non-condensing) Equipment Weight Approx. 20kg (actual product prevails) Dimensions 400×350×600mm (L×W×H) Power Supply Single-phase AC220V±10%, 50HZ±1HZ Application Cases · Imaging Comparison
Defect Type EPL Imaging EL Imaging Imaging Analysis Misalignment EPL Misalignment Imaging EL Misalignment Imaging Comparable to EL imaging capability, accurately captures series resistance defects, with stable or even better imaging performance, meeting core misalignment detection needs. Broken Grid EPL Broken Grid Imaging EL Broken Grid Imaging Using three-channel imaging technology, broken grid defects are clearly outlined with higher recognizability, results are intuitive and easy for quick defect judgment. Multiple Defects EPL Multiple Defects EL Multiple Defects No probe interference, green box areas cover all defects without omission, red box areas highlight broken grid features, accurate detection of multiple defect types. Slight + Severe Broken Grid EPL Slight+Severe Broken Grid EL Slight+Severe Broken Grid EPL shows slight broken grid more clearly, can detect incomplete breaks not recognized by EL, while also clearly presenting severe broken grid defects. Intelligent Software & Production Line Integration
Self-developed AI algorithm — Quickly set defect types and detection criteria, stronger accuracy and adaptability
Integrated Windows platform software, one-click configuration, low operation threshold
Real-time data communication, production line alarm/stop/rejection linkage
RGB three-channel color imaging, more accurate manual resolution
Automatic statistics of defect ratio/yield, aiding process optimization
Compatible with cell/module lines, flexible online/offline deployment
Throughout the PV Product Lifecycle
University Research · Corporate R&D · Production Line QC · Cell/Module Sorting
Detects Cracks/Broken Grid/Cold Solder/Black Spots/Concentric Circles etc. Probe-Free · Non-Contact · Non-Destructive
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